Quantification of void networks of as-sprayed and annealed nanostructured yttria-stabilized zirconia (YSZ) deposits manufactured by suspension plasma spraying

Surface and Coatings Technology

Volumn 205, Issue 3, 2010, Pages 683-689

  Bacciochini, Antoine ^a   Ben Ettouil, Fadhel ^a   Brousse, Elodie ^a   Ilavsky, Jan ^b   Montavon, Ghislain ^a   Denoirjean, Alain ^a   Valette, Stéphane ^a   Fauchais, Pierre ^a  

^a UNIVERSITY OF LIMOGES   (France)

^b ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

Annealing; Nanovoid; Suspension plasma spraying; USAXS; Void network; YSZ

Indexed keywords

NANOVOID; SUSPENSION PLASMA SPRAYING; USAXS; VOID NETWORKS; YSZ;

ANNEALING; DEPOSITS; HELIUM; NETWORK ARCHITECTURE; PLASMA JETS; PLASMA SPRAYING; PLASMAS; PROTECTIVE COATINGS; SINTERING; SIZE DETERMINATION; SIZE DISTRIBUTION; SUSPENSIONS (FLUIDS); X RAY SCATTERING; YTTRIA STABILIZED ZIRCONIA; YTTRIUM ALLOYS; ZIRCONIA;

VOID FRACTION;

EID: 77956652625     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.surfcoat.2010.06.013     Document Type: Article

References (40)

1. Fauchais P., Etchart-Salas R., Delbos C., Tognonvi M., Rat V., Coudert J.-F., Chartier T. J. Phys. D: Appl. Phys. 2007, 40:2394.
2. Fauchais P., Rat V., Coudert J.-F., Chartier T., Bianchi L. Plasma Sci. IEE Trans. 2005, 2:33.
3. Kaßner H., Vaßen R., Stöver D. Surf. Coat. Technol. 2008, 202:4355.
4. Fazilleau J., Delbos C., Rat V., Coudert J.F., Fauchais P., Pateyron B. Plasma Chem. Plasma Process. 2006, 26:371.
5. Delbos C., Fazilleau J., Rat V., Coudert J.F., Fauchais P., Pateyron B. Plasma Chem. Plasma Process. 2006, 26:393.
6. Pawlowski L. Surf. Coat. Technol. 2008, 202:4318.
7. Basu S., Cetegen B.M. Int. Heat Mass Transf. 2007, 50:3278.
8. Ilavsky J. Thermal Spray Conference 2009: Expanding Thermal Spray Performance to New Markets and Applications 2009, 920. ASM International, Materials Park, OH, USA. B.R. Marple, M.M. Hyland, Y.-C. Lau, C.-J. Li, R.S. Lima, G. Montavon (Eds.).
9. ASTM C373 Standard test method for water absorption, bulk density, apparent porosity, and apparent specific gravity of fired whiteware products 1989, American Society for Testing and Materials, Philadelphia, PA, USA.
10. Kuroda S., Dendo T., Kitahara S. J. Therm. Spray Technol. 1995, 4:75.
11. Ilavsky J., Berndt C.C., Karthikeyan J. J. Mater. Sci. 1997, 32:3925.
12. Cesar M.G., Vasconcelos D.C.L., Vasconcelos W.L. J. Mater. Sci. 2002, 37:2323.
13. Sevostianov I., Kachanov M. Mater. Sci. Eng. A 2001, 297:235.
14. Russ J.C., DeHoff R.T. Practical Stereology 1999, Plenum Press, New York, NY, USA. 2nd ed.
15. Bobzin K., Bagcivan N., Parkot D., Kashko T., Laschet G., Scheele J. J. Therm. Spray Technol. 2009, 18:988.
16. Sauer J.P. J. Therm. Spray Technol. 2005, 14:313.
17. Puerta D.G. J. Therm. Spray Technol. 2005, 14:450.
18. Puerta D.G. J. Therm. Spray Technol. 2006, 15:31.
19. Zhang J., Desai V. Surf. Coat. Technol. 2005, 190:98.
20. Jayaraj B., Desai V.H., Lee C.K., Sohn Y.H. Mater. Sci. Eng. A 2004, 372:278.
21. S. Beauvais, (in French) Influence of the porosity on the electrical properties of plasma sprayed layers, Ph.D. thesis, Ecole Nationale Supérieure des Mines de Paris, France, 2003.
22. Brousse E., Montavon G., Fauchais P., Denoirjean A., Rat V., Coudert J.-F., Ageorges H., Wittmann-Teneze K., Caron N. International Thermal Spray Conference: Crossing Border 2008, 547. DVS Verlag, Düsseldorf, Germany. E. Lugscheider (Ed.).
23. Bacchiochini A., Montavon G., Ilavsky J., Denoirjean A., Fauchais P. J. Therm. Spray Technol. 2010, 19:198.
24. H. Malot, (in French) Investigation on cylindrical liquid jet atomization: experimental development and maximum entropy formalism, Ph.D. Thesis, University of Rouen, France, 2001.
25. Lee C.S., Reitz R.D. Atomization Sprays 2001, 11:1.
26. Etchart-Salas R., Rat V., Coudert J.-F., Fauchais P., Caron N., Wittmann K., Alexandre S. J. Therm. Spray. Technol. 2007, 16:857.
27. Curran J.A., Clyne T.W. Acta Mater 2006, 54:1985.
28. Cowan R.D. J. Appl. Phys. 1963, 34:926.
29. Narayanan T. Soft Matter: Scattering, Imaging and Manipulation 2007, Springer, Berlin, Germany. 1st ed. R. Borsali, R. Pecora (Eds.).
30. Ilavsky J., Allen A.J., Long G.G., Jemian P.R. Rev. Sci. Instrum. 2002, 73:1660.
31. Guinier A., Fournet G. Small-angle scattering of X-rays 1955, J. Wiley and Sons, New York, USA.
32. Ilavsky J., Jemian P.R., Allen A.J., Zhang F., Levine L.E., Long G.G. J. Appl. Crystallogr. 2009, 42:347.
33. O. Glatter, O. Kratky, in Small Angle X-Ray Scattering, ed; by. Academic Press Inc. London Ltd., (New York, USA, 1982) p. 154.
34. Ilavsky J., Jemian P.R. J. Appl. Crystallogr. 2009, 42:347.
35. Ilavsky J., Allen A.J., Long G.G., Herman H., Berndt C.C. J. Mater. Sci. 1997, 32(13):3407.
36. Bing H., Lin J.-Z. J. Therm. Spray Technol. 2009, 18:887.
37. Chungen Z., Na W., Zhenbo W., Shengkai G., Huibin X. Scr. Mater. 2004, 51:945.
38. Huang C., Xiaming Z., Chuanxian D. J. Eur. Ceram. Soc. 2003, 23:1449.
39. Cernuschi F., Bison P., Moscatelli A. Acta Mater. 2009, 57:3460.
40. Schlichting K.W., Padture N.P., Klemens P.G. J. Mater. Sci. 2001, 36:3003.