-
1
-
-
32044471662
-
-
Inokuma, Y.; Kwon, J. H.; Ahn, T. K.; Yoo, M.-C.; Kim, D.; Osuka, A. Angew. Chem., Int. Ed. 2006, 45, 961-964
-
(2006)
Angew. Chem., Int. Ed.
, vol.45
, pp. 961-964
-
-
Inokuma, Y.1
Kwon, J.H.2
Ahn, T.K.3
Yoo, M.-C.4
Kim, D.5
Osuka, A.6
-
3
-
-
34247542507
-
-
Inokuma, Y.; Yoon, Z. S.; Kim, D.; Osuka, A. J. Am. Chem. Soc. 2007, 129, 4747-4761
-
(2007)
J. Am. Chem. Soc.
, vol.129
, pp. 4747-4761
-
-
Inokuma, Y.1
Yoon, Z.S.2
Kim, D.3
Osuka, A.4
-
4
-
-
41449112177
-
-
Tsurumaki, E.; Saito, S.; Kim, K. S.; Lim, J. M.; Inokuma, Y.; Kim, D.; Osuka, A. J. Am. Chem. Soc. 2008, 130, 438-439
-
(2008)
J. Am. Chem. Soc.
, vol.130
, pp. 438-439
-
-
Tsurumaki, E.1
Saito, S.2
Kim, K.S.3
Lim, J.M.4
Inokuma, Y.5
Kim, D.6
Osuka, A.7
-
5
-
-
33846493042
-
-
Kobayashi, N.; Takeuchi, Y.; Matsuda, A. Angew. Chem., Int. Ed. 2007, 46, 758-760
-
(2007)
Angew. Chem., Int. Ed.
, vol.46
, pp. 758-760
-
-
Kobayashi, N.1
Takeuchi, Y.2
Matsuda, A.3
-
6
-
-
34447128302
-
-
Takeuchi, Y.; Matsuda, A.; Kobayashi, N. J. Am. Chem. Soc. 2007, 129, 8271-8281
-
(2007)
J. Am. Chem. Soc.
, vol.129
, pp. 8271-8281
-
-
Takeuchi, Y.1
Matsuda, A.2
Kobayashi, N.3
-
7
-
-
51949090395
-
-
Inokuma, Y.; Easwaramoorthi, S.; Jang, S. Y.; Kim, K. S.; Kim, D.; Osuka, A. Angew. Chem., Int. Ed. 2008, 47, 4840-4843
-
(2008)
Angew. Chem., Int. Ed.
, vol.47
, pp. 4840-4843
-
-
Inokuma, Y.1
Easwaramoorthi, S.2
Jang, S.Y.3
Kim, K.S.4
Kim, D.5
Osuka, A.6
-
8
-
-
51949106663
-
-
Inokuma, Y.; Easwaramoorthi, S.; Yoon, Z. S.; Kim, D.; Osuka, A. J. Am. Chem. Soc. 2008, 130, 12234-12235
-
(2008)
J. Am. Chem. Soc.
, vol.130
, pp. 12234-12235
-
-
Inokuma, Y.1
Easwaramoorthi, S.2
Yoon, Z.S.3
Kim, D.4
Osuka, A.5
-
9
-
-
73349117510
-
-
Hayashi, S.; Inokuma, Y.; Easwaramoorthi, S.; Kim, K. S.; Kim, D.; Osuka, A. Angew. Chem., Int. Ed. 2010, 49, 321-324
-
(2010)
Angew. Chem., Int. Ed.
, vol.49
, pp. 321-324
-
-
Hayashi, S.1
Inokuma, Y.2
Easwaramoorthi, S.3
Kim, K.S.4
Kim, D.5
Osuka, A.6
-
10
-
-
77956575123
-
-
-1)
-
-1).
-
-
-
-
13
-
-
33746408757
-
-
Bruöckner, C.; Foss, P. C. D.; Sullivan, J. O.; Pelto, R.; Zeller, M.; Birge, R. R.; Crundwell, G. Phys. Chem. Chem. Phys. 2006, 8, 2402-2412
-
(2006)
Phys. Chem. Chem. Phys.
, vol.8
, pp. 2402-2412
-
-
Bruöckner, C.1
Foss, P.C.D.2
Sullivan, J.O.3
Pelto, R.4
Zeller, M.5
Birge, R.R.6
Crundwell, G.7
-
15
-
-
0002871880
-
-
Muöllen, K.; Wegner, G., Eds.; VCH: Weinheim, Germany
-
Electronic Materials: The Oligomer Approach; Muöllen, K.; Wegner, G., Eds.; VCH: Weinheim, Germany, 1998; pp 105 - 197.
-
(1998)
Electronic Materials: The Oligomer Approach
, pp. 105-197
-
-
-
17
-
-
0038631829
-
-
Izumi, T.; Kobashi, S.; Takimiya, K.; Aso, Y.; Otsubo, T. J. Am. Chem. Soc. 2003, 125, 5286-5287
-
(2003)
J. Am. Chem. Soc.
, vol.125
, pp. 5286-5287
-
-
Izumi, T.1
Kobashi, S.2
Takimiya, K.3
Aso, Y.4
Otsubo, T.5
-
18
-
-
77956568523
-
-
For the full citation, see the Supporting Information
-
For the full citation, see the Supporting Information.
-
-
-
-
19
-
-
33747703733
-
-
Tao, X.-C.; Zhou, W.; Zhang, Y.-P.; Dai, C.-Y.; Shen, D.; Huang, M. Chin. J. Chem. 2006, 24, 939-942
-
(2006)
Chin. J. Chem.
, vol.24
, pp. 939-942
-
-
Tao, X.-C.1
Zhou, W.2
Zhang, Y.-P.3
Dai, C.-Y.4
Shen, D.5
Huang, M.6
-
21
-
-
0037007919
-
-
Odobel, F.; Suresh, S.; Blart, E.; Nicolas, Y.; Quintard, J.-P.; Janvier, P.; Le Questel, J.-Y.; Illien, B.; Rondeau, D.; Richomme, P.; Haöupl, T.; Wallin, S.; Hammarstroöm, L. Chem. - Eur. J. 2002, 8, 3027-3046
-
(2002)
Chem. - Eur. J.
, vol.8
, pp. 3027-3046
-
-
Odobel, F.1
Suresh, S.2
Blart, E.3
Nicolas, Y.4
Quintard, J.-P.5
Janvier, P.6
Le Questel, J.-Y.7
Illien, B.8
Rondeau, D.9
Richomme, P.10
Haöupl, T.11
Wallin, S.12
Hammarstroöm, L.13
|