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Volumn , Issue , 2010, Pages 1189-1192

Comparing process flow of monolithic CMOS-MEMS intergration on SOI wafers with monolithic BiMOS-MEMS integration on silicon wafer

Author keywords

[No Author keywords available]

Indexed keywords

ANALOG DEVICES; CMOS-MEMS; CONTROL ELECTRONICS; ELECTRONICS SYSTEM; FABRICATION PROCESS; INTEGRATED CIRCUIT INDUSTRIES; INTEGRATED MEMS; MECHANICAL SENSORS; MECHANICAL TRANSDUCERS; MEMSDEVICES; MICROELECTROMECHANICAL SYSTEMS ACCELEROMETERS; MONOLITHIC INTEGRATION; PROCESS FLOWS; SILICON SUBSTRATES; SILICON-ON-INSULATOR SUBSTRATES; SINGLE CRYSTAL SILICON; SOI WAFERS; SURFACE MICROMACHINING TECHNOLOGY;

EID: 77956567570     PISSN: 15483746     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MWSCAS.2010.5548876     Document Type: Conference Paper
Times cited : (2)

References (3)
  • 3
    • 0036646553 scopus 로고    scopus 로고
    • Complementary metal oxide semiconductor cantilever arrays on a single chip: Mass-sensitive detection of volatile organic compounds
    • Lange D, Hagleitner C, Hierleman A, Brand O and Baltes H "Complementary metal oxide semiconductor cantilever arrays on a single chip: mass-sensitive detection of volatile organic compounds." Analytical Chemistry 74 (2002) 3084-95.
    • (2002) Analytical Chemistry , vol.74 , pp. 3084-3095
    • Lange, D.1    Hagleitner, C.2    Hierleman, A.3    Brand, O.4    Baltes, H.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.