Certification of NIST Standard Reference Material 640d

Powder Diffraction

Volumn 25, Issue 2, 2010, Pages 187-190

  Black, David R ^a   Windover, Donald ^a   Henins, Albert ^a   Gil, David ^a   Filliben, James ^a   Cline, James P ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Certification; Lattice parameter; Silicon; Standard reference material; X ray diffraction

Indexed keywords

ADVANCED DESIGN FEATURES; CERTIFICATION; CERTIFIED VALUES; INSTRUMENT PERFORMANCE; NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY; POWDER DIFFRACTION; POWDER DIFFRACTOMETERS; STANDARD REFERENCE MATERIAL;

DESIGN; DIFFRACTION; LATTICE CONSTANTS; SILICON; SYSTEMATIC ERRORS; X RAY DIFFRACTION;

DIFFRACTOMETERS;

EID: 77956537714     PISSN: 08857156     EISSN: 19457413     Source Type: Journal    
DOI: 10.1154/1.3409482     Document Type: Article

References (18)

1. Bergamin A, Cavagnero G, Mana G, Zosi G. Lattice parameter and thermal expansion of monocrystalline silicon. J. Appl. Phys. 1997, 82:5396-5400. JAPIAU, 0021-8979, 10.1063/1.366308.
2. Bergmann J, Kleeberg R, Haase A, Breidenstein B. Advanced fundamental parameters model for improved profile analysis. Proceedings of the Fifth European Conference on Residual Stresses, Delft-Noordwijkerhout, The Netherlands 2000, 303-308. A. J. Böttger, R. Delhez, E. J. Mittemeijer, edited by.
3. 2008, Bruker AXS GmbH, TOPAS General Profile and Structure Analysis Software for Powder Diffraction Data, V4.0 (computer program), Karlsruhe, Germany.
4. Cheary RW, Coelho AA. A fundamental parameters approach to X-ray line-profile fitting. J. Appl. Crystallogr. 1992, 25:109-121. JACGAR, 0021-8898, 10.1107/S0021889891010804.
5. Cheary RW, Coelho AA. Axial divergence in a conventional X-ray powder diffractometer.I. Theoretical foundations. J. Appl. Crystallogr. 1998a, 31:851-861. JACGAR, 0021-8898, 10.1107/S0021889898006876.
6. Cheary RW, Coelho AA. Axial divergence in a conventional X-ray powder diffractometer. II. Implementation and comparison with experiment. J. Appl. Crystallogr. 1998b, 31:862-868. JACGAR, 0021-8898, 10.1107/S0021889898006888.
7. Cline JP. Industrial Applications of X-ray Diffraction 2000, 903-917. F. H. Chung, D. K. Smith, edited by and (Marcel Dekker, New York).
8. Hölzer G, Fritsch M, Deutsch M, Härtwig J, Förster E. Kα1,2 and Kβ1,3 X-ray emission lines of the 3d transition metals. Phys. Rev. A 1997, 56:4554-4568. PLRAAN, 1050-2947, 10.1103/PhysRevA.56.4554.
9. Guide to the Expression of Uncertainty in Measurement 1993, ISO, 1st ed. (International Organization for Standardization, Geneva, Switzerland).
10. Kessler EG, Henins A, Deslattes RD, Nielsen L, Arif M. Precision comparison of the lattice parameters of silicon monocrystals. J. Res. Natl. Inst. Stand. Technol. 1994, 99:1-18. JRITEF, 1044-677X.
11. Maskil M, Deutsch M. X-ray Kα satellites of copper. Phys. Rev. A 1988, 38:3467-3472. PLRAAN, 1050-2947, 10.1103/PhysRevA.38.3467.
12. Lanthanum hexaboride powder line position and line shape standard for powder diffraction. 2000, NIST, Standard SRM 660a, National Institute of Standards and Technology, U.S. Department of Commerce, Gaithersburg, MD.
13. Alumina internal standard for quantitative analysis by X-ray powder diffraction. 2008, NIST, Standard SRM 676a, National Institute of Standards and Technology, U.S. Department of Commerce, Gaithersburg, MD.
14. Silicon powder line position and line shape standard for powder diffraction. 2009, NIST, Standard SRM 640d, National Institute of Standards and Technology, U.S. Department of Commerce, Gaithersburg, MD.
15. Rietveld HM. Line profiles of neutron powder-diffraction peaks for structure refinement. Acta Crystallogr. Sect. A: Cryst. Phys., Diffr., Theor. Gen. Crystallogr. 1967, 22:151-152. ACACBN, 0567-7394, 10.1107/S0365110X67000234.
16. Rietveld HM. A profile refinement method for nuclear and magnetic structures. J. Appl. Crystallogr. 1969, 2:65-71. JACGAR, 0021-8898, 10.1107/S0021889869006558.
17. Taylor BN, Kuyatt CE. 1994, and. Guidelines for Evaluating and Expressing the Uncertainty of NIST Measurement Results (NIST Technical Note 1297), U.S. Government Printing Office, Washington, D.C.
18. van Berkum JG M, Sprong GJ M, de Keijser T, Delhez R, Sonneveld EJ. The optimum standard specimen for X-ray diffraction line-profile analysis. Powder Diffr. 1995, 10:129-139. PODIE2, 0885-7156.