Combined multiple-excitation FP method for micro-XRF analysis of difficult samples

Powder Diffraction

Volumn 25, Issue 2, 2010, Pages 182-186

  Elam, W T ^a   Scruggs, Bruce ^a   Nicolosi, Joseph ^a  

^a Ametek   (United States)

Author keywords

Fundamental parameter method; Micro XRF; Primary beam filter

Indexed keywords

CHARACTERISTIC LINES; DIFFRACTION PHENOMENON; EXCITATION CONDITIONS; FUNDAMENTAL PARAMETER METHOD; MICRO-XRF; MINOR AND TRACE ELEMENTS; OPTIMIZED CONDITIONS; PRIMARY-BEAM FILTER;

POLYCRYSTALLINE MATERIALS;

SPECTRUM ANALYSIS;

EID: 77956506290     PISSN: 08857156     EISSN: 19457413     Source Type: Journal    
DOI: 10.1154/1.3409113     Document Type: Article

References (5)

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2. Scruggs B, Haschke M, Herczeg L, Nicolosi J. XRF mapping: New tools for distribution analysis. Adv. X-Ray Anal. 2000, 42:19-25. AXRAAA, 0376-0308.
3. Sutton SR, Rivers ML, Smith JV. Synchrotron X-ray fluorescence: Diffraction interference. Anal. Chem. 1986, 58:2167-2171. ANCHAM, 0003-2700, 10.1021/ac00124a013.
4. Tissot RG, Goehner RP. Diffraction peaks in x-ray spectroscopy: Friend or foe?. Adv. X-Ray Anal. 1992, 36:89-96. AXRAAA, 0376-0308.
5. Verkhovodov PK. Effect of crystal structure on the background intensity in XRF. X-Ray Spectrom. 2005, 34:169-171. XRSPAX, 0049-8246, 10.1002/xrs.780.