Effect of crystal structure on the background intensity in XRF

X-Ray Spectrometry

Volumn 34, Issue 2, 2005, Pages 169-171

  Verkhovodov, Petro O ^a  

^a Box 51   (Ukraine)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; DIFFRACTION;

BRAGG DIFFRACTION; CRYSTAL PLANES; CRYSTALS STRUCTURES; DIFFRACTION PEAKS; PRIMARY RADIATIONS; RADIATION SOURCE; X RAY FLUORESCENCE;

POLYCRYSTALLINE MATERIALS;

EID: 14544271940     PISSN: 00498246     EISSN: None     Source Type: Journal    
DOI: 10.1002/xrs.780     Document Type: Article

References (9)

1. Verkhovodov PO. X-Ray Spectrometric Analysis, Separated Corrections for Physical Processes. Naukova Dumka: Kyiv, 1992.
2. Smagunova AN, Belova AN, Afonin VP, Losev NF. Ind. Lab. 1964; 30: 426.
3. Burley RA. Appl. Spectrosc. 1967; 21: 416.
4. Fuchs E, Mecke P. Z. Angew. Phys. 1961; 13: 111.
5. Losev NF. Quantitative X-Ray Fluorescence Analysis. Nauka: Moscow, 1969.
6. Losev NF, Smagunova AN. The Foundation of X-Ray Fluorescence Analysis. Khimiya: Moscow, 1982.
7. Bakhtiarov AV. X-Ray Fluorescence Analysis in Geology and Geochemistry. Nedra: Leningrad, 1985.
8. Verkhovodov PO. X-Ray Spectrom. 1993; 22: 103.
9. Blokhin MA, Shveizer IG. X-Ray Spectral Directory. Nauka: Moscow, 1982.