Reliability qualification of photovoltaic smart panel electronics

Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA

Volumn , Issue , 2010, Pages

  Chaparala, Prasad ^a   Li, Erhong ^a   Bhola, Sameer ^a  

^a NATIONAL SEMICONDUCTOR CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DISTRIBUTED POWER; ELECTRONIC PRODUCT; INTEGRATED ELECTRONICS; QUALIFICATION TEST; RELIABILITY QUALIFICATION; SMART PANELS; SOLAR PANELS;

ELECTRONICS INDUSTRY; FAILURE ANALYSIS; INTEGRATED CIRCUITS;

QUALITY ASSURANCE;

EID: 77956447081     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IPFA.2010.5531993     Document Type: Conference Paper

References (5)

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2. M. Vazquez and I. Rey-Stolle "Photovoltaic Module Reliability Model Based on Field Degradation Studies" in Progress in Photovoltaics: Research and Applications, 2008, 16:419-433.
3. S. Kurtz et al. in34th IEEE Photovoltaic Specialists Conference, 2009 p. 2399-2404.
4. S. Yang, et al., "An Industry-Based Survey of Reliability in Power Electronic Converters", 2009 IEEE ECCE, p.3151-3157.
5. C.R. Osterwald and T. J. McMahon "History of Accelerated and Qualification Testing of Terrestrial Photovoltaic Modules: A Literature Review", in Progress in Photovoltaics: Research and Applications, 2009, 17:11-33.