Silicon bipolar LNAs in the X and Ku bands

Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems

Volumn 1, Issue , 2002, Pages 113-116

  Girlando, Giovanni ^a   Ferla, Giuseppe ^a   Ragonese, Egidio ^b   Palmisano, Giuseppe ^b  

^a STMICROELECTRONICS   (Italy)

^b UNIVERSITY OF CATANIA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

BIPOLAR TECHNOLOGY; CASCODE TOPOLOGY; FULLY INTEGRATED; INPUT IMPEDANCE; INPUT IMPEDANCE MATCHING; KU BAND; ON-WAFER TESTS; OUTPUT MATCHING; POWER GAINS; RESONANT LOAD; SILICON BIPOLAR;

ELECTRIC IMPEDANCE MEASUREMENT; SILICON WAFERS;

ELECTRIC IMPEDANCE;

EID: 77956375802     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICECS.2002.1045346     Document Type: Conference Paper

References (6)

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