Effect of contact statistics on electrical contact resistance

Journal of Applied Physics

Volumn 94, Issue 11, 2003, Pages 7215-7221

  Jang, Yong Hoon ^a   Barber, J R ^b  

^a Yonsei University   (South Korea)

^b UNIVERSITY OF MICHIGAN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CIRCULAR CONTACTS; CONTACT SPOTS;

ALGORITHMS; BOUNDARY VALUE PROBLEMS; DEFORMATION; ELECTRIC CONTACTS; FRACTALS; INTEGRAL EQUATIONS; PROBABILITY; STATISTICAL METHODS; SURFACE ROUGHNESS;

ELECTRIC CONDUCTORS;

EID: 0348222282     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1622995     Document Type: Article

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