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Volumn 35, Issue 17, 2010, Pages 2849-2851

In situ loss measurement of direct UV-written waveguides using integrated Bragg gratings

Author keywords

[No Author keywords available]

Indexed keywords

BRAGG GRATING STRUCTURE; COUPLING LOSS; HIGH-PRECISION MEASUREMENT; IN-SITU; LOSS MEASUREMENT; LOW LOSS; NONDESTRUCTIVE METHODS; OPTICAL POWER; PROPAGATION LOSS; RATIOMETRIC; SILICA-ON-SILICON; UV-WRITTEN WAVEGUIDE;

EID: 77956304878     PISSN: 01469592     EISSN: 15394794     Source Type: Journal    
DOI: 10.1364/OL.35.002849     Document Type: Article
Times cited : (51)

References (8)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.