Quantum-confined Stark effect measurements in Ge/SiGe quantum-well structures

Optics Letters

Volumn 35, Issue 17, 2010, Pages 2913-2915

  Chaisakul, Papichaya ^a   Marris Morini, Delphine ^a   Isella, Giovanni ^b   Chrastina, Daniel ^b   Roux, Xavier Le ^a   Gatti, Eleonora ^c   Edmond, Samson ^a   Osmond, Johann ^a,d   Cassan, Eric ^a   Vivien, Laurent ^a  

^a UNIVERSITÉ PARIS SACLAY   (France)

^b POLITECNICO DI MILANO   (Italy)

^c UNIVERSITY OF MILANO BICOCCA   (Italy)

^d ICFO INSTITUT DE CIENCIES FOTONIQUES   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVE REGIONS; DIFFERENTIAL TRANSMISSION; EXCITON ABSORPTION PEAK; FRACTION OF LIGHT; LOW-ENERGY PLASMA; MULTIPLE QUANTUM WELLS; OPTICAL TRANSMISSIONS; PIN DIODE; QUANTUM CONFINED STARK EFFECT; QUANTUM WELL STRUCTURES; REVERSE BIAS VOLTAGE; ROOM TEMPERATURE; STARK SHIFT; THERMAL CONTRIBUTIONS;

ABSORPTION; LIGHT TRANSMISSION; PLASMA DEPOSITION; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; SEMICONDUCTOR DEVICE STRUCTURES; SPECTROSCOPY; STARK EFFECT;

SEMICONDUCTOR QUANTUM WELLS;

EID: 77956300663     PISSN: 01469592     EISSN: 15394794     Source Type: Journal    
DOI: 10.1364/OL.35.002913     Document Type: Article

References (15)

1. M. Paniccia and S. Koehl, IEEE Spectrum 42, 38 (2005).
2. D. Marris-Morini, L. Vivien, J. M. Fédéli, E. Cassan, P. Lyan, and S. Laval, Opt. Express 16, 334 (2008).
3. L. Vivien, J. Osmond, J.-M. Fédéli, D. Marris-Morini, P. Crozat, J.-F. Damlencourt, E. Cassan, Y. Lecunff, and S. Laval, Opt. Express 17, 6252 (2009).
4. A. W. Fang, H. Park, O. Cohen, R. Jones, M. J. Paniccia, and J. E. Bowers, Opt. Express 14, 9203 (2006).
5. J. Liu, X. Sun, R. C. Aguilera, L. C. Kimerling, and J. Michel, Opt. Lett. 35, 679 (2010).
6. Y.-H. Kuo, Y. Lee, Y. Ge, S. Ren, J. E. Roth, T. I. Kamins, D. A. B. Miller, and J. S. Harris, Nature 437, 1334 (2005).
7. J. Liu, M. Beals, A. Pomerene, S. Bernardis, R. Sun, J. Cheng, L. C. Kimerling, and J. Michel, Nat. Photon. 2, 433 (2008).
8. D. Chrastina, G. Isella, B. Rössner, M. Bollani, E. Müller, T. Hackbarth, and H. von Känel, Thin Solid Films 459, 37 (2004).
9. S. Tsujino, H. Sigg, G. Mussler, D. Chrastina, and H. von Känel, Appl. Phys. Lett. 89, 262119 (2006).
10. M. Bonfanti, E. Grilli, M. Guzzi, M. Virgilio, G. Grosso, D. Chrastina, G. Isella, H. von Känel, and A. Neels, Phys. Rev. B 78, 041407(R) (2008).
11. M. Virgilio, M. Bonfanti, D. Chrastina, A. Neels, G. Isella, E. Grilli, M. Guzzi, G. Grosso, H. Sigg, and H. von Känel, Phys. Rev. B 79, 075323 (2009).
12. C. Lange, N. S. Köster, S. Chatterjee, H. Sigg, D. Chrastina, G. Isella, H. von Känel, M. Schäfer, M. Kira, and S. W. Koch, Phys. Rev. B 78, 201306(R) (2009).
13. C. Lange, N. S. Köster, S. Chatterjee, H. Sigg, D. Chrastina, G. Isella, H. von Känel, B. Kunert, and W. Stolz, Phys. Rev. B 81, 045320 (2010).
14. P. Blood, IEEE J. Quantum Electron. 36, 354 (2000).
15. D. A. B. Miller, D. S. Chemla, T. C. Damen, A. C. Gossard, W. Wiegmann, T. H. Wood, and C. A. Burrus, Phys. Rev. B 32, 1043 (1985).