Nanometer axial resolution by three-dimensional supercritical angle fluorescence microscopy

Physical Review Letters

Volumn 105, Issue 10, 2010, Pages

  Winterflood, Christian M ^a   Ruckstuhl, Thomas ^a   Verdes, Dorinel ^a   Seeger, Stefan ^a  

^a UNIVERSITY OF ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ANGULAR INTENSITY DISTRIBUTION; AXIAL POSITIONS; AXIAL RESOLUTIONS; CRITICAL ANGLES; MICROSCOPE SLIDE; NANOMETER RESOLUTIONS; OPTICAL AXIS; SUPER-CRITICAL; TOTAL INTERNAL REFLECTIONS;

ANGULAR DISTRIBUTION; FLUORESCENCE; FLUORESCENCE MICROSCOPY; REFRACTIVE INDEX;

LIGHT REFLECTION;

EID: 77956296145     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.105.108103     Document Type: Article

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