Quality metric evaluation of a physical unclonable function derived from an IC's power distribution system

Proceedings - Design Automation Conference

Volumn , Issue , 2010, Pages 240-243

  Helinski, Ryan ^a   Acharyya, Dhruva ^b   Plusquellic, Jim ^a  

^a UNIVERSITY OF NEW MEXICO   (United States)

^b Verigy Inc   (United States)

Author keywords

Hardware security; Process variations; Unique identifier

Indexed keywords

CIRCUIT ARCHITECTURES; COLLISION PROBABILITY; CRYPTOGRAPHIC PROTOCOLS; CURRENT PRACTICES; DIGITAL DATAS; DIGITAL RIGHTS MANAGEMENT; ENVIRONMENTAL VARIATIONS; HARDWARE SECURITY; MANUFACTURING VARIATION; PHYSICAL UNCLONABLE FUNCTIONS; POWER DISTRIBUTION SYSTEM; PROCESS VARIATION; QUALITY CRITERIA; QUALITY METRICES; QUALITY METRICS; RANDOM FUNCTIONS; REPRODUCIBILITIES; SECRET KEY; SECURITY PROTOCOLS; SINGLE-BIT; SOI TECHNOLOGY; SUPPLY NOISE; UNIQUE IDENTIFIERS;

ACCESS CONTROL; COMPUTER AIDED DESIGN; COPYRIGHTS; CRYPTOGRAPHY; DIGITAL INTEGRATED CIRCUITS; ELECTRIC LOAD DISTRIBUTION; FUNCTION EVALUATION; NETWORK PROTOCOLS; PROBABILITY DISTRIBUTIONS; QUALITY CONTROL; SILICON ON INSULATOR TECHNOLOGY;

NETWORK SECURITY;

EID: 77956203762     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1837274.1837336     Document Type: Conference Paper

References (8)

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