Influence of thickness, width and temperature on critical current density of Nb thin film structures

Physica C: Superconductivity and its Applications

Volumn 470, Issue 19, 2010, Pages 953-956

  Il'in, K ^a   Rall, D ^a   Siegel, M ^a   Engel, A ^b   Schilling, A ^b   Semenov, A ^c   Huebers, H W ^c  

^a KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

^b PHYSIK INSTITUT DER UNIVERSITÄT ZÜRICH   (Switzerland)

^c GERMAN AEROSPACE CENTER DLR   (Germany)

Author keywords

De pairing critical current density; De pinning of magnetic vortices; Thin Nb films

Indexed keywords

DE-PAIRING CRITICAL CURRENT DENSITY; DE-PINNING OF MAGNETIC VORTICES; GINZBURG-LANDAU; MAGNETIC VORTICES; NB FILM; SUBMICROMETERS; TEMPERATURE DEPENDENCIES; TEMPERATURE RANGE; THIN-FILM STRUCTURE;

CURRENT DENSITY; FILM THICKNESS; THIN FILMS;

CRITICAL CURRENTS;

EID: 77956120614     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physc.2010.02.042     Document Type: Conference Paper

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