Depairing critical currents and self-magnetic field effects in submicron YBa2Cu3O7-δ microbridges and bicrystal junctions

Low Temperature Physics

Volumn 30, Issue 3, 2004, Pages 203-207

  Ivanov, Z G ^a,b,c,d   Fogel, N Ya ^a,b,c,d   Yuzephovich, O I ^c,d   Stepantsov, E A ^d   Tzalenchuk, A Ya ^d  

^a CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

^b TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

^c B VERKIN INSTITUTE FOR LOW TEMPERATURE PHYSICS AND ENGINEERING   (Ukraine)

^d SHUBNIKOV INSTITUTE OF CRYSTALLOGRAPHY   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

BARIUM COMPOUNDS; BICRYSTALS; CRITICAL CURRENTS; GRAIN BOUNDARIES; MAGNETIC FIELD EFFECTS; SEMICONDUCTOR JUNCTIONS; TEMPERATURE DISTRIBUTION; VORTEX FLOW; YTTRIUM BARIUM COPPER OXIDES;

BICRYSTAL GRAIN BOUNDARY; BICRYSTAL JUNCTIONS; MICROBRIDGES; SELF-MAGNETIC FIELDS; SMALL-ANGLE GRAIN BOUNDARIES; TEMPERATURE DEPENDENCE; TRANSPORT CURRENTS; VORTEX MOTION;

COPPER COMPOUNDS;

EID: 22544461637     PISSN: 1063777X     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1645178     Document Type: Article

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