Synthesis and characterization of AgI thin films at low temperature

Journal of Alloys and Compounds

Volumn 506, Issue 1, 2010, Pages 268-270

  Sankapal, Babasaheb ^a   Baviskar, Prashant ^a   Salunkhe, Dipak ^a  

^a NORTH MAHARASHTRA UNIVERSITY   (India)

Author keywords

Characterizations; Chemical method; Silver iodide; Thin films

Indexed keywords

AQUEOUS MEDIUM; CHEMICAL METHOD; COATED GLASS; CRYSTAL PHASIS; DIRECT BAND GAP; INDIUM DOPED TIN OXIDES; LOW TEMPERATURES; OPTICAL ABSORPTION SPECTROSCOPY; OPTICAL TRANSMISSIONS; ROOM TEMPERATURE; SEM; SILVER IODIDE; SILVER NITRATES; SOURCE MATERIAL; SURFACE PHOTOVOLTAGES; SYNTHESIS AND CHARACTERIZATIONS; TRANSITION TEMPERATURE;

ABSORPTION SPECTROSCOPY; ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; CHARACTERIZATION; ITO GLASS; LIGHT TRANSMISSION; POTASSIUM; POTASSIUM IODIDE; SCANNING ELECTRON MICROSCOPY; SURFACE PROPERTIES; SURFACE ROUGHNESS; THICK FILMS; THIN FILMS; TIN; TIN OXIDES; TITANIUM COMPOUNDS; VAPOR DEPOSITION; X RAY DIFFRACTION;

SILVER;

EID: 77956095500     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2010.06.190     Document Type: Article

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