Wide band gap p-type windows by CBD and SILAR methods

Thin Solid Films

Volumn 451-452, Issue , 2004, Pages 128-132

  Sankapal, B R ^a   Goncalves, E ^a   Ennaoui, A ^a   Lux Steiner, M Ch ^a  

^a HAHN MEITNER INSTITUT   (Germany)

Author keywords

Chemical methods; P Type; Thin films; Wide band gap

Indexed keywords

ATOMIC FORCE MICROSCOPY; COPPER COMPOUNDS; CURRENT VOLTAGE CHARACTERISTICS; LIGHT ABSORPTION; LIGHT TRANSMISSION; MORPHOLOGY; SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

CHEMICAL METHODS; WIDE BAND GAP;

THIN FILMS;

EID: 17644438278     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2003.11.002     Document Type: Conference Paper

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