Evaluating quartz crystallographic preferred orientations and the role of deformation partitioning using EBSD and fabric analyser techniques

Journal of Structural Geology

Volumn 32, Issue 6, 2010, Pages 803-817

  Peternell, Mark ^a   Hasalová, Pavlína ^b   Wilson, Christopher J L ^a   Piazolo, Sandra ^c   Schulmann, Karel ^d  

^a UNIVERSITY OF MELBOURNE   (Australia)

^b MONASH UNIVERSITY   (Australia)

^c STOCKHOLM UNIVERSITY   (Sweden)

^d UNIVERSITÉ DE STRASBOURG   (France)

Author keywords

Crystallographic preferred orientation; Deformation partitioning; Electron back scattered diffraction; Fabric analyser; Quartz; Thaya dome

Indexed keywords

BULK ORIENTATIONS; C-AXIS ORIENTATIONS; CRYSTALLOGRAPHIC PREFERRED ORIENTATIONS; DEFORMATION PARTITIONING; ELECTRON BACK SCATTER DIFFRACTION; ELECTRON BACK-SCATTERED DIFFRACTION; MATRIX; MICRO-SCALES; MINIMAL SAMPLE; ORTHOGNEISSES; QUARTZ GRAINS; SLIP SYSTEM; STRAIN PARTITIONING; TEMPERATURE FIELD; TEXTURAL HETEROGENEITIES; THAYA DOME; THIN SECTION; UNIAXIAL MATERIALS;

DEFORMATION; DIFFRACTION; DOMES; FABRICS; SILICATE MINERALS; STRUCTURAL GEOLOGY; X RAY POWDER DIFFRACTION;

QUARTZ;

CRYSTALLOGRAPHY; DEFORMATION; MEASUREMENT METHOD; ORTHOGNEISS; P-T CONDITIONS; PREFERRED ORIENTATION; QUARTZ; SLIP RATE; STRAIN PARTITIONING; TEMPERATURE GRADIENT; TEXTURE;

EID: 77955919465     PISSN: 01918141     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jsg.2010.05.007     Document Type: Article

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