A resistive mesh phantom for assessing the performance of EIT systems

IEEE Transactions on Biomedical Engineering

Volumn 57, Issue 9, 2010, Pages 2257-2266

  Gagnon, Hervé ^a   Cousineau, Martin ^a,b   Adler, Andy ^c   Hartinger, Alzbeta E ^a  

^a ÉCOLE POLYTECHNIQUE DE MONTRÉAL   (Canada)

^b HEC MONTRÉAL   (Canada)

^c CARLETON UNIVERSITY   (Canada)

Author keywords

Biomedical instrumentation; electrical impedance tomography (EIT); resistive mesh phantom

Indexed keywords

AG/AGCL; APPLIED CURRENT; ARBITRARY SHAPE; BIOMEDICAL INSTRUMENTATION; CONDUCTIVITY DISTRIBUTIONS; DATA FRAMES; ELECTRICAL IMPEDANCE TOMOGRAPHY; ELECTRICAL MODELS; ELECTRODE IMPEDANCE; ELECTRODE MODELS; FRAME RATE; HOMOGENEOUS MEDIUM; IMPEDANCE ANALYZER; IMPEDANCE CURVES; IN-VIVO; MEASUREMENT STRATEGIES; MODELING ACCURACY; OPERATING FREQUENCY; PARAMETER VALUES; PERFORMANCE INDICATORS; PRECISION RESISTORS; RESISTIVE MESH PHANTOM; SIMULTANEOUS MEASUREMENT;

BENCHMARKING; ELECTRIC IMPEDANCE; ELECTRIC IMPEDANCE MEASUREMENT; ELECTRIC IMPEDANCE TOMOGRAPHY; INSTRUMENTS; MEASUREMENTS; PRINTED CIRCUIT BOARDS; PRINTED CIRCUIT MANUFACTURE;

DIAGNOSTIC RADIOGRAPHY;

ACCURACY; ARTICLE; COMPUTER ASSISTED IMPEDANCE TOMOGRAPHY; CONDUCTANCE; ELECTRODE; IN VIVO STUDY; MEASUREMENT; PHANTOM; RESISTIVE MESH PHANTOM;

ELECTRIC IMPEDANCE; EQUIPMENT DESIGN; PHANTOMS, IMAGING; SIGNAL PROCESSING, COMPUTER-ASSISTED; TOMOGRAPHY;

EID: 77955914552     PISSN: 00189294     EISSN: None     Source Type: Journal    
DOI: 10.1109/TBME.2010.2052618     Document Type: Article

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