SCOPUS 정보 검색 플랫폼

Journal of Applied Physics

Volumn 108, Issue 2, 2010, Pages

A model for column angle evolution during oblique angle deposition

(3) Tanto, B a Ten Eyck, G b Lu, T M a

a RENSSELAER POLYTECHNIC INSTITUTE (United States)

b SANDIA NATIONAL LABORATORIES (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COLUMNAR STRUCTURES; EXPERIMENTAL DATA; FLAT SURFACES; INCIDENT FLUX; INPUT PARAMETER; OBLIQUE-ANGLE DEPOSITION; PROCESSING CONDITION; SEMIEMPIRICAL MODELS; SHADOWING EFFECTS; VAPOR CONDENSATION;

GERMANIUM;

AGGLOMERATION;

EID: 77955795070 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3465296 Document Type: Article

Times cited : (33)

References (9)

1
- 68949164590
- Cambridge University Press, Cambridge, England
- A. -L. Barabasi and H. E. Stanley, Surface Growth (Cambridge University Press, Cambridge, England, 1996).
- (1996) Surface Growth
- Barabasi, A.-L.¹ Stanley, H.E.²

2
- 0003805739
- (Cambridge University Press, New York).
- P. Meakin, Fractals, Scaling and Growth Far from Equilibrium (Cambridge University Press, New York, 1998).
- (1998) Fractals, Scaling and Growth Far from Equilibrium
- Meakin, P.¹

3
- 0002768734
- PTREAN 0031-7926.
- J. M. Nieuwenhuizen and H. B. Haanstra, Philips Tech. Rev. PTREAN 0031-7926 27, 87 (1966).
- (1966) Philips Tech. Rev. , vol.27 , pp. 87
- Nieuwenhuizen, J.M.¹ Haanstra, H.B.²

4
- 0027576680
- THSFAP 0040-6090,. 10.1016/0040-6090(93)90378-3
- R. N. Tait, T. Smy, and M. J. Brett, Thin Solid Films THSFAP 0040-6090 226, 196 (1993). 10.1016/0040-6090(93)90378-3
- (1993) Thin Solid Films , vol.226 , pp. 196
- Tait, R.N.¹ Smy, T.² Brett, M.J.³

5
- 0000452838
- PLRAAN 1050-2947,. 10.1103/PhysRevA.38.994
- P. Meakin, Phys. Rev. A PLRAAN 1050-2947 38, 994 (1988). 10.1103/PhysRevA.38.994
- (1988) Phys. Rev. A , vol.38 , pp. 994
- Meakin, P.¹

6
- 0001452797
- PRLTAO 0031-9007,. 10.1103/PhysRevLett.56.1396
- S. Lichter and J. Chen, Phys. Rev. Lett. PRLTAO 0031-9007 56, 1396 (1986). 10.1103/PhysRevLett.56.1396
- (1986) Phys. Rev. Lett. , vol.56 , pp. 1396
- Lichter, S.¹ Chen, J.²

7
- 36849015822
- PLRBAQ 0556-2805,. 10.1103/PhysRevB.76.235402
- D. X. Ye and T. M. Lu, Phys. Rev. B PLRBAQ 0556-2805 76, 235402 (2007). 10.1103/PhysRevB.76.235402
- (2007) Phys. Rev. B , vol.76 , pp. 235402
- Ye, D.X.¹ Lu, T.M.²

8
- 38849193536
- JVTBD9 1071-1023,. 10.1116/1.2834559
- P. I. Wang, O. Nalamasu, R. Ghoshal, R. Ghoshal, C. D. Schaper, A. Li, and T. -M. Lu, J. Vac. Sci. Technol. B JVTBD9 1071-1023 26, 244 (2008). 10.1116/1.2834559
- (2008) J. Vac. Sci. Technol. B , vol.26 , pp. 244
- Wang, P.I.¹ Nalamasu, O.² Ghoshal, R.³ Ghoshal, R.⁴ Schaper, C.D.⁵ Li, A.⁶ Lu, T.-M.⁷

9
- 0015326960
- THSFAP 0040-6090,. 10.1016/0040-6090(72)90276-3
- N. G. Nakhodkin and A. I. Shaldervan, Thin Solid Films THSFAP 0040-6090 10, 109 (1972). 10.1016/0040-6090(72)90276-3
- (1972) Thin Solid Films , vol.10 , pp. 109
- Nakhodkin, N.G.¹ Shaldervan, A.I.²

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