Electron back-scattering diffraction (EBSD) measurements of antigorite lattice-preferred orientations (LPO)

Journal of Microscopy

Volumn 239, Issue 3, 2010, Pages 245-248

  Van De Moortele B ^a   Bezacier, L ^a   Trullenque, G ^b   Reynard, B ^a  

^a UNIVERSITÉ LYON 1   (France)

^b Oxford Instruments GmbH   (Germany)

Author keywords

anisotropy; Antigorite; deformation; EBSD; lattice prefered orientation; serpentine

Indexed keywords

AMORPHIZATION; BACKSCATTERING; ELECTRONS; KAOLINITE; MAGNESITE; SCANNING ELECTRON MICROSCOPY; SERPENTINE; X RAY DIFFRACTION;

ANTIGORITE; CLUSTERINGS; DIFFRACTION MEASUREMENTS; ELECTRON BACKSCATTERING DIFFRACTIONS (EBSD); LATTICE PREFERED ORIENTATION; LATTICE PREFERRED ORIENTATION; MEASUREMENTS OF; PHYLLOSILICATE; PROPERTY; STRONG ANISOTROPY;

ANISOTROPY;

SERPENTINE; SILICATE;

ACCURACY; ANALYTIC METHOD; ANISOTROPY; ARTICLE; ELECTRIC CONDUCTIVITY; ELECTRON BACKSCATTERING DIFFRACTION; ELECTRON DIFFRACTION; MEASUREMENT; PRIORITY JOURNAL; RELIABILITY; ROCK; SCANNING ELECTRON MICROSCOPE; VELOCITY; X RAY DIFFRACTION;

EID: 77955740239     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/j.1365-2818.2010.03398.x     Document Type: Article

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