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Volumn 55, Issue 22, 2010, Pages 6553-6562
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Enhanced photoelectrochemical activity of electro-synthesized CdS-Bi 2S3 composite films grown with self-designed cross-linked structure
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Author keywords
Anodic stripping voltammetry; Electrochemical deposition; Electrochemical impedance spectroscopy; Electron microscopy; Thin film liquid junction solar cell
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Indexed keywords
ANODIC STRIPPING VOLTAMMETRY;
BAND GAP ENERGY;
BINARY SYSTEMS;
CDS;
CHARACTERISTIC PEAKS;
CHEMICAL COMPOSITIONS;
COMPOSITIONAL VARIATION;
CONDUCTING GLASS;
CROSSLINKED STRUCTURES;
CRYSTALLINE STRUCTURE;
DONOR DENSITY;
ELECTROCHEMICAL DEPOSITION;
ELECTROCHEMICAL IMPEDANCE;
ELECTROCHEMICAL POLARIZATION;
ENERGY DISPERSIVE ANALYSIS OF X-RAYS;
FILM SURFACES;
HIGH ORDER;
METAL OXIDES;
MORPHOLOGICAL STUDY;
NANO-POROUS;
NONAQUEOUS BATH;
OVERTONE BANDS;
PHOTOACTIVITY;
PHOTOELECTROCHEMICAL APPLICATIONS;
PHOTOELECTROCHEMICAL MEASUREMENTS;
PHOTOELECTROCHEMICALS;
PRECURSOR SALTS;
RAMAN SPECTRAL DATA;
RELATIVE POSITIONS;
SEMICONDUCTIVITY;
SOLAR CONVERSION EFFICIENCIES;
SPECTROFLUORIMETRIC;
SPECTROPHOTOMETRIC MEASUREMENTS;
THERMAL STABILITY;
THERMOGRAVIMETRY;
THIN SEMICONDUCTOR FILMS;
X-RAY DIFFRACTION STUDIES;
BIOELECTRIC PHENOMENA;
CADMIUM;
CADMIUM COMPOUNDS;
CADMIUM SULFIDE;
CAPACITANCE MEASUREMENT;
CONDUCTIVE FILMS;
CONVERSION EFFICIENCY;
CROSSLINKING;
DATA STORAGE EQUIPMENT;
DEPOSITION;
DIELECTRIC PROPERTIES;
DIFFERENTIAL THERMAL ANALYSIS;
DISSOLUTION;
ELECTROCHEMICAL CORROSION;
ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY;
ELECTRODEPOSITION;
ELECTRONS;
LIQUIDS;
METAL RECOVERY;
POLARIZATION;
REDUCTION;
SCANNING ELECTRON MICROSCOPY;
SEMICONDUCTOR JUNCTIONS;
SOLAR CELLS;
SPECTRUM ANALYSIS;
SUBSTRATES;
THERMOGRAVIMETRIC ANALYSIS;
THIN FILMS;
TRANSMISSION ELECTRON MICROSCOPY;
VOLTAMMETRY;
X RAY DIFFRACTION;
X RAY DIFFRACTION ANALYSIS;
COMPOSITE FILMS;
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EID: 77955709561
PISSN: 00134686
EISSN: None
Source Type: Journal
DOI: 10.1016/j.electacta.2010.06.022 Document Type: Article |
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Times cited : (63)
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References (36)
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