Thin-film active nano-PWAS for structural health monitoring

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7292, Issue PART 1, 2009, Pages

  Lin, Bin ^a   Giurgiutiu, Victor ^a   Bhalla, Amar S ^b   Chen, Chonglin ^b   Guo, Ruyan ^b   Jiang, Jiechao ^c  

^a The Department of Mechanical Engineering   (United States)

^b UNIVERSITY OF TEXAS AT SAN ANTONIO   (United States)

^c UNIVERSITY OF TEXAS AT ARLINGTON   (United States)

Author keywords

Nano PWAS; Pulsed laser deposition; Structural health monitoring; Thin film

Indexed keywords

AS-GROWN; DIELECTRIC AND FERROELECTRIC PROPERTIES; INTER-DIFFUSION; INTERFACE STRUCTURES; LARGE DIELECTRIC CONSTANT; MICRO-STRUCTURAL; NANO LAYERS; NANO-PWAS; NANOPILLAR STRUCTURES; OPTIMAL SYNTHESIS; OPTIMUM DESIGNS; PHASED ARRAYS; PIEZOELECTRIC RESPONSE; PIEZOELECTRIC WAFER ACTIVE SENSORS; PITCH-CATCH; POTENTIAL APPLICATIONS; PULSE ECHOES; PULSED LASER; RESEARCH OBJECTIVES; SMART MATERIALS; STRUCTURAL COMPONENT; STRUCTURAL HEALTH; STRUCTURE MATERIALS; THIN FILM FABRICATION; THIN-FILM DEPOSITIONS; USEFUL LIFE;

BARIUM TITANATE; CHEMICAL VAPOR DEPOSITION; CONCRETE BRIDGES; DEPOSITION; DIELECTRIC LOSSES; FABRICATION; FERROELECTRIC FILMS; FERROELECTRICITY; HEALTH; HYSTERESIS; MONITORING; NANOSENSORS; PIEZOELECTRICITY; PULSED LASER DEPOSITION; PULSED LASERS; RESEARCH; SYNTHESIS (CHEMICAL); TECHNOLOGY; THIN FILMS;

STRUCTURAL HEALTH MONITORING;

EID: 77955705459     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.814397     Document Type: Conference Paper

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