Precise frequency measurements of 127I2 lines in the wavelength region 750-780 nm

Journal of the Optical Society of America B: Optical Physics

Volumn 27, Issue 6, 2010, Pages 1208-1214

  Liao, Chun Chieh ^a   Wu, Kuo Yu ^a   Lien, Yu Hung ^a   Knöckel, Horst ^b   Chui, Hsiang Chen ^a,c   Tiemann, Eberhard ^b   Shy, Jow Tsong ^a  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

^b LEIBNIZ UNIVERSITY HANNOVER   (Germany)

^c NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FREQUENCY MEASUREMENT; FREQUENCY MODULATION; NATURAL FREQUENCIES; OPTICAL MATERIALS;

ABSOLUTE FREQUENCY; DOPPLER; ERROR LIMITS; FREQUENCY INSTABILITIES; FREQUENCY MEASUREMENTS; HIGH-PRECISION FREQUENCY; HYPERFINE TRANSITION; HYPERFINES; IMPROVED MODELS; MODEL DESCRIPTION; OPTICAL FREQUENCY COMBS; RELATIVE UNCERTAINTY; TI: SAPPHIRE LASER; WAVELENGTH RANGES; WAVELENGTH REGIONS;

UNCERTAINTY ANALYSIS;

EID: 77955698211     PISSN: 07403224     EISSN: None     Source Type: Journal    
DOI: 10.1364/JOSAB.27.001208     Document Type: Article

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