Precise frequency measurements of I2 lines in the near infrared by Rb reference lines

European Physical Journal D

Volumn 11, Issue 2, 2000, Pages 213-225

  Bodermann, B ^a   Klug, M ^a   Winkelhoff, U ^a   Knockel H ^a   Tiemann, E ^a  

^a INSTITUT FÜR QUANTENOPTIK   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

FOUR WAVE MIXING; INFRARED DEVICES; PHOTONS; SEMICONDUCTOR LASERS;

DIODE-LASER; FREQUENCY MEASUREMENTS; FREQUENCY REFERENCE; MEASUREMENTS OF; NEAR INFRARED; NEAR-INFRARED; REFERENCE DIODES; REFERENCE LINES; RELATIVE UNCERTAINTY; TWO-PHOTON TRANSITIONS;

UNCERTAINTY ANALYSIS;

EID: 0034238809     PISSN: 14346060     EISSN: None     Source Type: Journal    
DOI: 10.1007/s100530070086     Document Type: Article

References (36)

1. -1 (1982).
2. -1 (1982).
3. A. Arie, R.L. Byer, Opt. Commun. 111, 253 (1994).
4. A. Morinaga, K. Sugiyama, N. Ito, J. Helmcke, J. Opt. Soc. Am. B 6, 1656 (1989).
5. S. Kremser, B. Bodermann, H. Knöckel, E. Tiemann, Opt. Commun. 110, 708 (1994).
6. O. Acef, J.J. Zondy, M. Abed, D.G. Rovera, A.H. Gérard, A. Clairon, Ph. Laurent, Y. Millerioux, P. Juncar, Opt. Commun. 97, 29 (1993).
7. S.L. Cornish, Y.-W. Liu, I.C. Lane, P.E.G. Baird. G.P. Barwood, P. Taylor, W.R.C. Rowley, J. Opt. Soc. Am. B 17, 6 (2000).
8. P. Jungner, M.L. Eickhoff, S.D. Swartz, J. Ye, J.L. Hall, SPIE 2378, 22 (1995).
9. T.J. Quinn, Metrologia 30, 523 (1994).
10. S. Gerstenkorn, P. Luc, J. Phys. France 46, 867 (1985).
11. F. Martin, R. Bacis, S. Churassy, J. Verges, J. Mol. Spectrosc. 116, 71 (1986).
12. H. Knöckel, S. Kremser, B. Bodermann, E. Tiemann, Z. Phys. D 37, 43 (1996).
13. B. Bodermann, H. Knöckel, E. Tiemann (to be published).
14. B. Bodermann, G, Bönsch, H. Knöckel, A. Nicolaus, E. Tiemann, Metrologia 35, 105 (1998).
15. B. Bodermann, M. Klug, H. Knöckel, E. Tiemann, T. Trebst, H.R. Telle, Appl. Phys. B 67, 95 (1998).
16. G.P. Barwood, P. Gill, W.R.C. Rowley, J. Phys. E 21, 966 (1988).
17. F. Nez, F. Biraben, R. Felder, Y. Millerioux, Opt. Commun. 102, 432 (1993).
18. M. Breton, P. Tremblay, C. Julien, N. Cyr, M. Têtu, C. Latrasse, IEEE Trans. Instrum. Meas. 44, 162 (1995).
19. G.P. Barwood, P. Gill, W.R.C. Rowley, Appl. Phys. B 53, 142 (1991).
20. G.P. Barwood, P. Gill, W.R.C. Rowley, SPIE 1837, 262 (1992).
21. J. Helmcke, F. Beyer-Helms, PTB-Me 17, 85 (1977).
22. J. Ye, S. Swartz, P. Jungner, J.L. Hall, Opt. Lett. 21, 1280 (1996).
23. D. Touahri, O. Acef, A. Clairon, J.-J. Zondy, R. Felder, L. Hilico, B. de Beauvoir, F. Biraben, F. Nez, Opt. Commun. 133, 471 (1997).
24. B. Dahmani, L. Hollberg, R. Drullinger, Opt. Lett. 12, 876 (1987).
25. H. Li, H.R. Telle, IEEE J. Quant. Electron. 18, 257 (1989).
26. F. Spieweck, IEEE Trans. Instrum. Meas. IM-34, 246 (1985).
27. S. Picard, Metrologia 26, 235 (1989).
28. R. Grimm, J. Mlyneck, Appl. Phys. B 49, 179 (1989).
29. M.D. Levenson, Introduction to Nonlinear Laser Spectroscopy (Academic Press, 1982).
30. O. Schmidt, K.-M. Knaak, R. Wynands, D. Meschede, Appl. Phys. B 59, 167 (1994).
31. R. Felder, D. Touahri, O. Acef, L. Hilico, J.J. Zondy, A. Clairon, B. de Beauvoir, F. Biraben, L. Julien, F. Nez, Y. Millerioux, SPIE 2378, 52 (1995).
32. F. Biraben, M. Inguscio, F. Martin, F. Pavone, Laser Phys. 4, 349 (1994).
33. Ch.J. Bordé, C.R. Acad. Sci. B 282, 341 (1976).
34. C. Koch, H.R. Telle, Opt. Comm. 91, 371 (1992).
35. C. Koch, H.R. Telle, J. Opt. Soc. Am. B 13, 1666 (1996).
36. B. Bodermann, H. Knöckel, E. Tiemann (to be published).