All-solid-state reflectance-type electrochromic devices using iridium tin oxide film as counter electrode

Thin Solid Films

Volumn 518, Issue 18, 2010, Pages 5340-5344

  Niwa, Tatsuo ^a   Takai, Osamu ^a  

^a NAGOYA UNIVERSITY   (Japan)

Author keywords

Electrochromic device; Iridium oxide; Solid electrolyte; Tantalum oxide; Thin film; Tin oxide; Tungsten oxide

Indexed keywords

ALL-SOLID-STATE; COUNTER ELECTRODES; DRIVE TEST; HIGH TEMPERATURE; ION PLATING; IRIDIUM OXIDE; IRIDIUM OXIDES; OPTICAL CHARACTERISTICS; OXIDE MATRIX; RESPONSE TIME; TUNGSTEN OXIDE;

ELECTROCHROMIC DEVICES; ELECTROCHROMISM; FILM PREPARATION; HEAT RESISTANCE; ION IMPLANTATION; IRIDIUM; IRIDIUM COMPOUNDS; IRIDIUM PLATING; OXIDE FILMS; REDUCTION; REFLECTION; SOLID ELECTROLYTES; SOLID STATE DEVICES; TANTALUM; THIN FILMS; TIN; TIN OXIDES; TITANIUM COMPOUNDS; TUNGSTEN; TUNGSTEN COMPOUNDS;

TANTALUM OXIDES;

EID: 77955659415     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2010.04.030     Document Type: Article

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