Optical and electrochemical properties of all-solid-state transmittance-type electrochromic devices

Thin Solid Films

Volumn 518, Issue 6, 2010, Pages 1722-1727

  Niwa, Tatsuo ^a   Takai, Osamu ^a  

^a NAGOYA UNIVERSITY   (Japan)

Author keywords

Electrochromic device; Impedance method; Iridium oxide; Solid electrolyte; Tantalum oxide; Thin film; Tungsten oxide

Indexed keywords

AC IMPEDANCE METHOD; ALL-SOLID-STATE; DRY PROCESS; ELECTROCHROMICS; ENVIRONMENTAL CONDITIONS; FAST RESPONSE; IMPEDANCE METHOD; IRIDIUM OXIDES; PROTON CONDUCTING SOLID ELECTROLYTES; RESPONSE SPEED; TANTALUM OXIDE; THIN LAYERS; TUNGSTEN OXIDE; VARYING TEMPERATURE;

ACTIVATION ENERGY; ELECTRIC CONDUCTIVITY MEASUREMENT; ELECTROCHEMICAL PROPERTIES; ELECTROCHROMIC DEVICES; ELECTROCHROMISM; ELECTROLYSIS; IRIDIUM; IRIDIUM COMPOUNDS; OXIDES; SOLID ELECTROLYTES; TANTALUM; THIN FILM DEVICES; THIN FILMS; TUNGSTEN; TUNGSTEN COMPOUNDS;

TANTALUM OXIDES;

EID: 73449114626     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2009.11.062     Document Type: Article

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