A broader view of the economic design of the X-bar chart in the semiconductor industry

International Journal of Production Research

Volumn 48, Issue 19, 2010, Pages 5843-5857

  Baud Lavigne, B ^a   Bassetto, S ^a   Penz, B ^a  

^a GRENOBLE INSTITUTE OF TECHNOLOGY   (France)

Author keywords

economic design of control chart; learning; ramp up; scrap investigation

Indexed keywords

BAR CHART; CONTROL CHARTS; CORRELATION ANALYSIS; ECONOMIC DESIGN; ENGINEERING TEAMS; NEW MODEL; OPTIMAL CONTROLS; OPTIMAL QUANTITY; PROCESS DATA; PROCESS INTEGRATION; PROCESS MODEL; SEMICONDUCTOR INDUSTRY; SET-POINT; YIELD IMPROVEMENT;

CONTROL SYSTEMS; DESIGN; FLOWCHARTING; INDUSTRY; OPTIMIZATION; SEMICONDUCTOR DEVICE MANUFACTURE; STATISTICAL PROCESS CONTROL;

QUALITY CONTROL;

EID: 77955581467     PISSN: 00207543     EISSN: 1366588X     Source Type: Journal    
DOI: 10.1080/00207540903150593     Document Type: Article

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