Economic in-line inspection sampling strategy with learning effects

International Journal of Production Research

Volumn 38, Issue 18, 2000, Pages 4811-4821

  Jang, Wooseung ^a   Wang, Eric H ^b   Akella, Ramakrishna ^c  

^a UNIVERSITY OF MISSOURI   (United States)

^b ABN AMRO Asia Limited   (Taiwan)

^c UNIVERSITY AT BUFFALO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COST EFFECTIVENESS; LEARNING SYSTEMS; SAMPLING; SEMICONDUCTOR DEVICE MANUFACTURE;

ECONOMIC IN-LINE INSPECTION SAMPLING;

INSPECTION;

EID: 0034672919     PISSN: 00207543     EISSN: None     Source Type: Journal    
DOI: 10.1080/00207540010001875     Document Type: Article

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