Deformation of single crystal sample using D-DIA apparatus coupled with synchrotron X-rays: In situ stress and strain measurements at high pressure and temperature

Journal of Physics and Chemistry of Solids

Volumn 71, Issue 8, 2010, Pages 1053-1058

  Girard, Jennifer ^a   Chen, Jiuhua ^a   Raterron, Paul ^b   Holyoke, Caleb ^c  

^a The Department of Electrical and Computer Engineering   (United States)

^b UNIVERSITÉ LILLE 1   (France)

^c TEXAS A AND M UNIVERSITY   (United States)

Author keywords

A. Inorganic compounds; B. X ray diffraction; C. High pressure; D. Mechanical properties

Indexed keywords

DEFORMATION; INORGANIC COMPOUNDS; STRAIN RATE; X RAY DIFFRACTION; X RAY RADIOGRAPHY;

HIGH PRESSURE; HIGH-PRESSURE AND HIGH-TEMPERATURE DEFORMATION EXPERIMENTS; HIGH-PRESSURE AND TEMPERATURES; IN-SITU TIME-RESOLVED X-RAY DIFFRACTION; POLYCRYSTALLINE SAMPLES; RHEOLOGICAL PROPERTY; SAMPLE PREPARATION; SINGLE CRYSTAL SAMPLES;

SINGLE CRYSTALS;

EID: 77955560309     PISSN: 00223697     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jpcs.2010.03.005     Document Type: Conference Paper

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