Linear Gaussian blur evolution for detection of blurry images

IET Image Processing

Volumn 4, Issue 4, 2010, Pages 302-312

  Tsomko, E ^a   Kim, H J ^a   Izquierdo, E ^b  

^a Korea University   (South Korea)

^b QUEEN MARY UNIVERSITY OF LONDON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

AUTO-FOCUSING; AUTOMATIC DETECTION; BLURRY IMAGES; DETECTION ACCURACY; EVOLUTION CURVE; EXPOSURE-TIME; GAUSSIAN BLUR; IMAGE COLLECTIONS; INTEREST POINTS; LINEAR SCALE; MONTE CARLO; SCALE-SPACE; STORAGE CAPACITY;

CAMERAS; IMAGE QUALITY; MOTION COMPENSATION;

BIOLOGY;

EID: 77955532668     PISSN: 17519659     EISSN: None     Source Type: Journal    
DOI: 10.1049/iet-ipr.2009.0001     Document Type: Article

References (23)

1. Marziliano, P. Dufaux, F. Winkler, S. Ebrahimi, T.: 'A no-reference perceptual blur metric', Proc. Int. Conf. Image Processing, 2002, 3, p. 57-60
2. Marziliano, P. Dufaux, F. Winkler, S. Ebrahimi, T.: 'Perceptual blur and ringing metrics: application to JPEG 2000', Signal Process.: Image Commun., 2004, 19, p. 163-172, 0923-5965
3. Ong, E. Lin, W. Lu, Z.: et al. 'A no-reference quality metric for measuring image blur', Proc. Seventh Int. Symp. on Signal Processing and its Applications, 2003, 1, p. 469-472
4. Boult, B.E. Chiang, M.C.: 'Local blur estimation and super-resolution', Proc. IEEE Conf. Computer Vision and Pattern Recognition, 1997, p. 821-826
5. 'Sharpness measure: Towards automatic image enhancement', Technical, HPL-2004-84R-2, 2005
6. Hu, H. Haan, G.: 'Low cost robust blur estimator', Proc. IEEE, Int. Conf. Image Processing, 2006, p. 617-620
7. Firestone, L. Cook, K. Culp, K. Talsania, N. Preston, K.: 'Comparison of autofocus methods for automated microscopy', Cytometry, 1991, 12, p. 195-206
8. Marichal, X. Ma, W.Y. Zhang, H.J.: 'Blur determination in the compressed domain using DCT information', Proc. IEEE Int. Conf. Image Processing, 1999, p. 386-390
9. Caviedes, J. Gurbuz, S.: 'No-reference sharpness metric based on local edge kurtosis', Proc. IEEE Int. Conf. on Image Processing, 2002, 3, p. 53-56
10. 'Detection of out-of-focus digital photographs', Technical, HPL-2005-14, 2005
11. Liu, R. Li, Z. Jia, J.: 'Image partial blur detection and classification', Proc. IEEE Conf. Computer Vision and Pattern Recognition, 2008, p. 1-8
12. Tong, H. Mingjing, L. Hongjiang, Z. Changshui, Z.: 'Blur detection for digital images using wavelet transform', IEEE Int. Conf. on Multimedia and Expo (ICME), 2004, p. 17-20
13. Batten, C.F. Holburn, D.M. Breton, B.C. Caldwell, N.H.M.: 'Sharpness search algorithms for automatic focusing in the scanning electron microscope', J. Scanning Microsc., 2001, 23, (2), p. 112-113
14. 'An open implementation of SIFT detector and descriptor', UCLA CSD Technical, 070012, 2006
15. Zhang, Q. Chen, Y. Zhang, Y. Xu, Y.: 'SIFT implementation and optimization for multi-core systems', IEEE Int. Symp. on Parallel and Distributed Processing, 2008, p. 1-8
16. Tico, M. Trimeche, M. Vehvilainen, M.: 'Motion blur identification based on differently exposed images', IEEE Int. Conf. Image Processing, 2006, p. 2021-2024
17. Tsomko, E. Kim, H.J.: 'Efficient method of detecting globally blurry or sharp images', Proc. Ninth Int. Workshop on Image Analysis for Multimedia Interactive Services (WIAMIS), Klagenfurt, Austria, May 2008, p. 171-174
18. Koenderink, J.J.: 'The structure of images', Biol. Cybernet., 1984, 50, p. 363-370, 10.1007/BF00336961
19. Witkin, A.P.: 'Scale-space filtering', Proc. Int. Conf. Artificial Intelligence, 1983, p. 1019-1021
20. Izquierdo, E. Ghanbari, M.: 'Key components for an advanced segmentation system', IEEE Trans. Multimedia, 2002, 4, (1), p. 97-113
21. Lowe, D.G.: 'Distinctive image features from scale-invariant keypoints', Int. J. Comput. Vis., 2004, 60, p. 91-110, 10.1023/B:VISI.0000029664.99615.94, 0920-5691
22. Brown, M. Lowe, D.G.: 'Invariant features from interest point groups', Proc. British Machine Vision Conf., 2002, p. 656-665
23. Erasmus, S.J. Smith, K.C.A.: 'An automatic focusing and astigmatism correction system for the SEM and CTEM', J. Microsc., 1982, 127, p. 185-189, 0022-2720