Fast-gated single-photon avalanche diode for wide dynamic range near infrared spectroscopy

IEEE Journal on Selected Topics in Quantum Electronics

Volumn 16, Issue 4, 2010, Pages 1023-1030

  Dalla Mora, Alberto ^a   Tosi, Alberto ^a   Zappa, Franco ^a,b   Cova, Sergio ^a,b   Contini, Davide ^c   Pifferi, Antonio ^a,c   Spinelli, Lorenzo ^a   Torricelli, Alessandro ^a   Cubeddu, Rinaldo ^a,d  

^a POLITECNICO DI MILANO   (Italy)

^b Micro Photon Devices Srl   (Italy)

^c CNR   (Italy)

^d IFNCNR   (Italy)

Author keywords

Avalanche breakdown; infrared spectroscopy; time domain measurements

Indexed keywords

AVALANCHE BREAKDOWN; BACK-SCATTERED; DYNAMIC RANGE; INJECTED POWER; MEASUREMENT TIME; NOVEL TECHNIQUES; OPTICAL INVESTIGATION; OPTICAL MAMMOGRAPHY; OPTICAL MOLECULAR IMAGING; OPTICAL SIGNALS; SINGLE PHOTON AVALANCHE DIODE; SOURCE-DETECTOR SEPARATION; SUPERFICIAL LAYERS; THREE ORDERS OF MAGNITUDE; TIME DOMAIN MEASUREMENT; TIME INTERVAL; TIME RESOLUTION; TIME-CORRELATED SINGLE-PHOTON COUNTING; TIME-RESOLVED; TIME-RESOLVED REFLECTANCE; WIDE DYNAMIC RANGE;

AVALANCHE DIODES; INFRARED DEVICES; MICROPROCESSOR CHIPS; NEAR INFRARED SPECTROSCOPY; PARTICLE BEAMS; PHOTONS; SEMICONDUCTING SILICON COMPOUNDS; TIME DOMAIN ANALYSIS;

INFRARED SPECTROSCOPY;

EID: 77955517473     PISSN: 1077260X     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSTQE.2009.2035823     Document Type: Article

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