All-silicon 1.55-μm high-resolution photon counting and timing

IEEE Photonics Technology Letters

Volumn 20, Issue 23, 2008, Pages 1956-1958

  Tosi, Alberto ^a   Dalla Mora, Alberto ^a   Zappa, Franco ^a  

^a POLITECNICO DI MILANO   (Italy)

Author keywords

Avalanche photodiodes; Correlation; Optical fibers; Single photon avalanche diode (SPAD); Time correlated single photon counting (TCSPC)

Indexed keywords

AUTOCORRELATION MEASUREMENTS; AVALANCHE PHOTODIODES; CORRELATION; HIGH RESOLUTIONS; LASER CHARACTERIZATIONS; MEASUREMENT TIMES; PHOTON COUNTING; PHOTON DETECTIONS; PULSED LASERS; SHAPE CHARACTERIZATIONS; SINGLE PHOTONS; SINGLE-PHOTON AVALANCHE DIODE (SPAD); TIME RESOLUTIONS; TIME-CORRELATED SINGLE PHOTON COUNTING (TCSPC); TWO-PHOTON ABSORPTIONS; WIDE DYNAMIC RANGES;

AVALANCHES (SNOWSLIDES); CHARACTERIZATION; MULTIPHOTON PROCESSES; OPTICAL CORRELATION; OPTICAL FIBERS; OPTICAL MATERIALS; PARTICLE BEAMS; PHOTONS; PULSED LASER APPLICATIONS; SEMICONDUCTING SILICON COMPOUNDS; SILICON; SNOW;

AVALANCHE DIODES;

EID: 57049112631     PISSN: 10411135     EISSN: None     Source Type: Journal    
DOI: 10.1109/LPT.2008.2005788     Document Type: Article

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