Mechanism of drifts in H2S sensing properties of SnO 2:CuO composite thin film sensors prepared by thermal evaporation

Sensors and Actuators, B: Chemical

Volumn 96, Issue 1-2, 2003, Pages 245-252

  Katti, V R ^a   Debnath, A K ^a   Muthe, K P ^a   Kaur, Manmeet ^a   Dua, A K ^a   Gadkari, S C ^a   Gupta, S K ^a   Sahni, V C ^a  

^a BHABHA ATOMIC RESEARCH CENTRE   (India)

Author keywords

Hydrogen sulphide (H2S); X ray diffraction (XRD); X ray photoelectron spectroscopy (XPS)

Indexed keywords

COMPOSITE MATERIALS; COPPER OXIDES; EVAPORATION; HYDROGEN SULFIDE; OXIDATION; SYNTHESIS (CHEMICAL); THIN FILMS; TIN COMPOUNDS; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

THIN FILM SENSORS;

CHEMICAL SENSORS;

EID: 0242573375     PISSN: 09254005     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-4005(03)00532-X     Document Type: Article

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