Study of the physical property of the cadmium sulfide thin film depending on the process condition

Current Applied Physics

Volumn 10, Issue SUPPL. 3, 2010, Pages

  Kim, Maengjun ^a   Min, Bong Ki ^b   Kim, Chang Duk ^a   Lee, Sungho ^a,c   Kim, Hong Tak ^b   Jung, Sang Kooun ^a   Sohn, Sangho ^a  

^a Kyungpook National University   (South Korea)

^b Yeungnam University   (South Korea)

^c Nano Practical Application Center   (South Korea)

Author keywords

CdS; Chemical bath deposition; Stirring speed; Substrate

Indexed keywords

ATOMIC FORCE MICROSCOPES; CDS; CDS FILMS; CDS THIN FILMS; CDTE; CHEMICAL BATH DEPOSITION METHODS; CHEMICAL-BATH DEPOSITION; HETEROGENEOUS GROWTH; MORPHOLOGICAL STUDY; PROCESS CONDITION; SCANNING ELECTRON MICROSCOPE; STIRRING SPEED; STRUCTURAL CHARACTERISTICS; SUBSTRATE CRYSTALS; THIN FILM SOLAR CELLS; VARIOUS SUBSTRATES; WINDOW LAYER; X-RAY DIFFRACTION MEASUREMENTS;

CADMIUM; CADMIUM COMPOUNDS; CADMIUM SULFIDE; CRYSTAL STRUCTURE; DATA STORAGE EQUIPMENT; DEPOSITION; GROWTH KINETICS; MICROSCOPES; NICKEL OXIDE; PHYSICAL PROPERTIES; SCANNING ELECTRON MICROSCOPY; SPEED; SUBSTRATES; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; VAPOR DEPOSITION; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

FILM GROWTH;

EID: 77955476801     PISSN: 15671739     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cap.2010.02.027     Document Type: Conference Paper

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