Influence of annealing on the structure and ferroelectric properties of Sr0.13Na0.37Bi0.50TiO3 thin films prepared by metalorganic solution deposition

Journal of Alloys and Compounds

Volumn 504, Issue 1, 2010, Pages 155-158

  Xu, Huizhong ^a,b   Wang, Yaping ^b   Zhen, Liang ^a   Wang, Zhuo ^b  

^a HARBIN INSTITUTE OF TECHNOLOGY   (China)

^b YANTAI UNIVERSITY   (China)

Author keywords

Annealing; Ferroelectric properties; Metalorganic solution deposition; SNBT thin films

Indexed keywords

ANNEALING CONDITION; ANNEALING TEMPERATURES; ANNEALING TIME; FERROELECTRIC PROPERTY; MATRIX; METALORGANIC SOLUTION DEPOSITION; METALORGANIC SOLUTION DEPOSITIONS; PHASE CONTENT; REMNANT POLARIZATIONS; SECOND PHASE; SNBT THIN FILMS; TIO; TWO PHASIS;

ANNEALING; DEPOSITION; FERROELECTRIC FILMS; FERROELECTRICITY; SCANNING ELECTRON MICROSCOPY; SODIUM; THIN FILMS; VAPOR DEPOSITION; X RAY DIFFRACTION;

FILM PREPARATION;

EID: 77955468409     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2010.05.076     Document Type: Article

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