Na2so4 monocrystal nanowires - aspect ratio control and electron beam radiolysis

Inorganic Chemistry

Volumn 49, Issue 14, 2010, Pages 6748-6754

  Zheng, Ruiting ^a,b   Gao, Jinwei ^a,c   Yang, Tengfei ^b   Lan, Yucheng ^d   Cheng, Guoan ^b   Wang, Dezhi ^d   Ren, Zhifeng ^d   Chen, Gang ^a  

^a Massachusetts Institute of Technology Cambridge   (United States)

^b Beijing Normal University   (China)

^c SOUTH CHINA NORMAL UNIVERSITY   (China)

^d BOSTON COLLEGE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 77955437805     PISSN: 00201669     EISSN: None     Source Type: Journal    
DOI: 10.1021/ic100874r     Document Type: Article

References (26)

1. Sun, K. Y.; Khademhosseini, A.; Eng, G.; Langer, R. Langmuir 2004, 20, 6080-6084.
2. Sato, Y.; Koide, Y. Chem. Lett. 2009, 38, 674-675.
3. Pu, Y. C.; Hwu, J. R.; Su, W. C.; Shieh, D. B.; Tzeng, Y.; Yeh, C. S. J. Am. Chem. Soc. 2006, 128, 11606-11611.
4. Lou, X. W.; Yuan, C.; Zhang, Q.; Archer, L. A. Angew. Chem., Int. Ed. 2006, 45, 3825-3829.
5. (a) Tenne, R.; Rao, C. N. R. Philos. Trans. R. Soc., A 2004, 362, 2099-2125.
6. (b) Bommel, K. J. C.; Friggeri, A.; Shinkai, S.; Bommel, K. J. C; Friggeri, A.; Shinkai, S. Angew. Chem., Int. Ed. 2003, 42, 980-999.
7. (c) Lou, X. W.; Archer, L. A.; Yang, Z. Adv. Mater. 2008, 20, 3987-4019.
8. Amirthalingam, V.; Karkhanavala, M. D.; Rao, U. R. K. Acta Crystallogr. 1977, A33, 522-532.
9. (a) Peng, Z. A.; Peng, X. G. J. Am. Chem. Soc. 2001, 123, 1389-1395.
10. (b)Peng, Z. A.;Peng, X. G. J. Am. Chem. Soc. 2002, 124, 3343-3353.
11. (c) Wang, X.; Li, Y. Angew. Chem., Int. Ed. 2002, 41, 4190-4193.
12. (a) Vener, R. E.; Thompson, A. R. Ind. Eng. Chem. 1949, 41, 2242-2247.
13. (b) Vener, R. E.; Thompson, A. R. Ind. Eng. Chem 1950, 42, 171-174.
14. (a) Dasgupta, M.; Mahanti, M. K. Transit. Meta. Chem. 1986, 11, 286-288.
15. (b) Chen, Y. Catal. Today 1998, 44, 3-16.
16. (a) Li, X. L.; Liu, J. F.; Li, Y. D. Appl. Phys. Lett. 2002, 81, 4832-4834.
17. (b) Zhang, Y. W.; Yan, Z. G.; You, L. P.; Si, R.; Yan, C. H. Eur. J. Inorg. Chem. 2003, 10, 4099-1104.
18. (c) Yu, Y.; Jin, C. H.; Wang, R. H.; Chen, Q.; Peng, L. M. J. Phys. Chem. B 2005, 109, 18772-18776.
19. Zhang, J.; Fisher, T. S.; Gore, J. P.; Hazra, D.; Ramachandran, V. P. Int. J. Hydrogen Energy 2006, 31, 2292-2298.
20. (a) Li, Y. D.; Wang, J. W.; Deng, Z. X.; WU, Y. Y.; Yang, P. D. J. Am. Chem. Soc. 2001, 123, 9904-9905.
21. (b) Sun, X. M.; Chen, X.; Li, Y. D. Inorg. Chem. 2002, 41, 4996-1498.
22. (c) Li, Y. D.; Li, X. L.; He, R. R.; Zhu, J.; Deng, Z. X. J. Am. Chem. Soc. 2002, 124, 1411-1416.
23. (a) Hobbs, L. W.Introduction to Analytical Electron Microscopy. In Radiation effects in analysis by TEM; Hren, J. J., Goldstein, J. I. Joy, D. C., Eds.; Plenum: New York, 1987; pp 399-445.
24. (b) Hobbs, L. W. Scanning Microsc. Suppl. 1990, 4, 171-183.
25. (c) Egerton, R. F.; Crozier, P. A.; Rice, P. Ultramicroscopy 1987, 23, 305-312.
26. d)Egerton, R. F.; Li, P.; Malac, M. Micron 2004, 35, 399-409.