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Volumn 256, Issue 24, 2010, Pages 7442-7445

Structural and morphological study of ZnO thin films electrodeposited on n-type silicon

Author keywords

Diffraction; Electrodeposition; Morphology; Silicon; Zinc oxide

Indexed keywords

CORROSION; DIFFRACTION; ELECTRODEPOSITION; ELECTRODES; II-VI SEMICONDUCTORS; METALLIC FILMS; MORPHOLOGY; OPTICAL FILMS; SCANNING ELECTRON MICROSCOPY; SILICON; SILICON COMPOUNDS; SUBSTRATES; X RAY DIFFRACTION; ZINC OXIDE;

EID: 77955418140     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2010.05.087     Document Type: Article
Times cited : (11)

References (38)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.