Microwave sintering explored by X-ray microtomography

Ceramic Transactions

Volumn 209, Issue , 2010, Pages 211-217

  Ishizaki, Kotaro ^a   Battabyal, Manjusha ^a   Pittini, Yoko Yamada ^a   Nicula, Radu ^a   Vaucher, Sebastien ^a  

^a SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

DIAMONDS; METALLIC MATRIX COMPOSITES; METALS; MICROWAVE IRRADIATION; MIXTURES; POTENTIAL ENERGY; POWDER METALS; SINTERING; TOMOGRAPHY; X RAYS;

METAL-DIELECTRIC SYSTEM; MICROSTRUCTURAL CHANGES; MICROSTRUCTURAL INFORMATION; MICROWAVE ENERGIES; MICROWAVE PROCESSING; MICROWAVE SINTERING; SINTERING TEMPERATURES; X RAY MICROTOMOGRAPHY;

MICROWAVE MATERIALS PROCESSING;

EID: 77955382055     PISSN: 10421122     EISSN: None     Source Type: Book Series    
DOI: 10.1002/9780470599730.ch21     Document Type: Conference Paper

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