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Volumn 172, Issue 2, 2010, Pages 177-182

Structural, dielectric and ferroelectric properties of four-layer Aurivillius phase Na0.5La0.5Bi4Ti 4O15

Author keywords

Ceramics; Electron microscopy; Ferroelectrics; Phase transition; X ray diffraction

Indexed keywords

ACTIVATION ENERGY; ARRHENIUS PLOTS; BISMUTH COMPOUNDS; ELECTRON DIFFRACTION; ELECTRONS; FERROELECTRIC CERAMICS; FERROELECTRICITY; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; LANTHANUM COMPOUNDS; SODIUM COMPOUNDS; SOLID STATE REACTIONS; TITANIUM COMPOUNDS; X RAY POWDER DIFFRACTION;

EID: 77955306706     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2010.05.008     Document Type: Article
Times cited : (21)

References (32)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.