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Volumn 172, Issue 2, 2010, Pages 177-182
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Structural, dielectric and ferroelectric properties of four-layer Aurivillius phase Na0.5La0.5Bi4Ti 4O15
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Author keywords
Ceramics; Electron microscopy; Ferroelectrics; Phase transition; X ray diffraction
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Indexed keywords
ACTIVATION ENERGY;
ARRHENIUS PLOTS;
BISMUTH COMPOUNDS;
ELECTRON DIFFRACTION;
ELECTRONS;
FERROELECTRIC CERAMICS;
FERROELECTRICITY;
HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;
LANTHANUM COMPOUNDS;
SODIUM COMPOUNDS;
SOLID STATE REACTIONS;
TITANIUM COMPOUNDS;
X RAY POWDER DIFFRACTION;
AURIVILLIUS PHASE;
CERAMIC;
CONVENTIONAL SOLID STATE REACTION ROUTE;
DIELECTRIC AND FERROELECTRIC PROPERTIES;
HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;
POWDERED SAMPLES;
SELECTED AREA ELECTRON DIFFRACTION;
SYNTHESISED;
TEMPERATURE RANGE;
X- RAY DIFFRACTIONS;
SCANNING ELECTRON MICROSCOPY;
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EID: 77955306706
PISSN: 09215107
EISSN: None
Source Type: Journal
DOI: 10.1016/j.mseb.2010.05.008 Document Type: Article |
Times cited : (21)
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References (32)
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