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Physica E: Low-Dimensional Systems and Nanostructures

Volumn 42, Issue 8, 2010, Pages 2078-2080

Characterization of thin graphite layers and graphene by energy dispersive X-ray analysis

(4) Ilyin, A a Guseinov, N a Nikitin, A a Tsyganov, I a

a AL FARABI KAZAKH NATIONAL UNIVERSITY (Kazakhstan)

Author keywords

Energy dispersive spectroscopy; Graphene; Mechanical exfoliation; Radiation defects; Scanning electron microscopy

Indexed keywords

COPPER SURFACE; ENERGY DISPERSIVE X RAY SPECTROSCOPY; ENERGY DISPERSIVE X-RAY; GRAPHENE LAYERS; GRAPHITE LAYERS; LOW ENERGIES; MECHANICAL EXFOLIATION; PRIMARY ELECTRON BEAMS; RADIATION DEFECTS; RAMAN SPECTRA; SURFACE CARBON; ULTRA-THIN;

DEFECTS; ELECTRON BEAMS; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRONS; ENERGY DISPERSIVE SPECTROSCOPY; ENERGY DISPERSIVE X RAY ANALYSIS; GRAPHENE; GRAPHITE; MEASUREMENT THEORY; RADIATION DAMAGE; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SCANNING; X RAY SPECTROSCOPY; X RAYS;

SCANNING ELECTRON MICROSCOPY;

EID: 77955306051 PISSN: 13869477 EISSN: None Source Type: Journal
DOI: 10.1016/j.physe.2010.03.029 Document Type: Article

Times cited : (15)

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