Structure, optical and electrochromic properties of NiO thin films

Physica B: Condensed Matter

Volumn 405, Issue 16, 2010, Pages 3412-3420

  Sawaby, A ^a   Selim, M S ^a   Marzouk, S Y ^b   Mostafa, M A ^c   Hosny, A ^a  

^a NATIONAL RESEARCH CENTRE   (Egypt)

^b Arab Academy of Science and Technology ^*  (Egypt)

^c Beni Suef University   (Egypt)

Author keywords

Electrochromic materials; Nickel oxide; Solgel; Thin films

Indexed keywords

ABSORPTION COEFFICIENTS; ANNEALING TEMPERATURES; ELECTROCHROMIC BEHAVIOR; ELECTROCHROMIC MATERIALS; ELECTROCHROMIC PERFORMANCE; ELECTROCHROMIC PROPERTIES; ETHYL ALCOHOLS; EXTINCTION COEFFICIENT (K); INDIUM TIN OXIDE GLASS; NICKEL ACETATE TETRAHYDRATE; NICKEL OXIDE THIN FILMS; NIO THIN FILM; POLYCRYSTALLINE STRUCTURE; SCHERRER FORMULA; SOL GEL DIP COATING; SOL-GEL THIN FILMS; STARTING MATERIALS; TRANSMISSION ELECTRON MICROSCOPE; XRD;

COATINGS; ELECTROCHROMIC DEVICES; ELECTROCHROMISM; ETHANOL; FILM PREPARATION; ITO GLASS; NICKEL; NICKEL ALLOYS; NICKEL COATINGS; NICKEL OXIDE; OPTICAL CONSTANTS; ORGANIC POLYMERS; ORGANOMETALLICS; OXIDE FILMS; PARTICLE SIZE ANALYSIS; REFRACTIVE INDEX; THERMOGRAVIMETRIC ANALYSIS; THIN FILMS; TIN; TITANIUM COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY; VAPOR DEPOSITION; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

OPTICAL FILMS;

EID: 77955305899     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physb.2010.05.015     Document Type: Article

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