On-line full scan inspection of particle size and shape using digital image processing

Particuology

Volumn 8, Issue 3, 2010, Pages 286-292

  Liao, Chih Wei ^a   Yu, Jiun Hung ^a   Tarng, Yeong Shin ^a  

^a NATIONAL TAIWAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

Author keywords

Automatic inspection; Image analysis; Line scan CCD; Particle characterization; Particle size distribution

Indexed keywords

AUTOMATIC INSPECTION; DIGITAL IMAGE PROCESSING; ELECTRIC CONTROL; IMAGE PROCESSING MODULE; INDUSTRIAL USERS; INSPECTION SYSTEM; LINE SCAN CCD; NONUNIFORM; OPTICAL LINES; PARTICLE CHARACTERIZATION; PARTICLE IMAGES; PARTICLE SEPARATION; PARTICLE SIZE AND SHAPE;

CHARGE COUPLED DEVICES; DIGITAL IMAGE STORAGE; IMAGE ANALYSIS; IMAGING SYSTEMS; INSPECTION; OPTICAL DATA PROCESSING; PARTICLE SIZE; SIZE DISTRIBUTION;

PARTICLE SIZE ANALYSIS;

EID: 77955303562     PISSN: 16742001     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.partic.2010.03.015     Document Type: Article

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