Influence of X-ray irradiation on the optical properties of ruthenium(II)octa-(n-hexyl)-phthalocyanine thin film

Journal of Alloys and Compounds

Volumn 503, Issue 1, 2010, Pages 86-91

  El Nahass, M M ^a   Youssef, Tamer E ^b  

^a Ain Shams University   (Egypt)

^b NATIONAL RESEARCH CENTRE   (Egypt)

Author keywords

Optical properties; Phthalocyanines; Ruthenium thin films

Indexed keywords

ABSORPTION BAND; ABSORPTION COEFFICIENTS; ABSORPTION INDEXES; ABSORPTION MEASUREMENTS; ABSORPTION REGION; AS-DEPOSITED FILMS; DIFFERENT SUBSTRATES; DISPERSION CURVES; ELECTRIC DIPOLE STRENGTH; HIGH VACUUM; INDIRECT TRANSITION; IRRADIATED FILMS; MOLAR EXTINCTION COEFFICIENT; NORMAL INCIDENCE; OPTICAL ABSORPTION COEFFICIENTS; OSCILLATOR ENERGY; OSCILLATOR STRENGTHS; PHTHALOCYANINE MOLECULES; PHTHALOCYANINES; POLYCRYSTALLINE; SPECTROPHOTOMETRIC MEASUREMENTS; THERMAL EVAPORATION TECHNIQUE; TRICLINIC STRUCTURES; WAVELENGTH RANGES; X RAY IRRADIATION; XRD;

ABSORPTION; AMORPHOUS FILMS; NITROGEN COMPOUNDS; REFRACTIVE INDEX; RUTHENIUM; THERMAL EVAPORATION; THIN FILMS; VACUUM EVAPORATION; VAPOR DEPOSITION; X RAY DIFFRACTION;

OPTICAL FILMS;

EID: 77955303455     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2010.04.029     Document Type: Article

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