Structural and morphological characterization of ruthenium phthalocyanine films by energy dispersive X-ray diffraction and atomic force microscopy

Thin Solid Films

Volumn 382, Issue 1-2, 2001, Pages 74-80

  Caminiti, R ^a   Capobianchi, A ^b   Marovino, P ^a   Paoletti, A M ^b   Padeletti, G ^b   Pennesi, G ^b   Rossi, G ^b  

^a SAPIENZA UNIVERSITY OF ROME   (Italy)

^b CNR   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; CHEMICAL BONDS; DEPOSITION; DIMERS; MORPHOLOGY; RUTHENIUM COMPOUNDS; SUBLIMATION; VACUUM APPLICATIONS; X RAY DIFFRACTION ANALYSIS;

ENERGY DISPERSIVE X RAY DIFFRACTION (EDXD); RUTHENIUM PHTHALOCYANINE; VACUUM SUBLIMATION;

AMORPHOUS FILMS;

EID: 0034824608     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(00)01701-6     Document Type: Article

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