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Volumn , Issue , 2010, Pages 361-364
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Electrical conductivity characteristics of TiO2 thin film
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Author keywords
Annealing temperature; Conductivity; Resistivity
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Indexed keywords
4-POINT PROBE;
ANNEALED FILMS;
ANNEALING TEMPERATURES;
ELECTRICAL CONDUCTIVITY;
ELECTRICAL PROPERTY;
GLASS SUBSTRATES;
I-V MEASUREMENTS;
SEM;
SOL-GEL METHODS;
STRUCTURAL CHARACTERIZATION;
TIO;
ELECTRIC CONDUCTIVITY;
GELS;
SCANNING ELECTRON MICROSCOPY;
SOL-GEL PROCESS;
SPIN GLASS;
SUBSTRATES;
THERMOELECTRIC EQUIPMENT;
THIN FILMS;
TITANIUM;
TITANIUM DIOXIDE;
VAPOR DEPOSITION;
ANNEALING;
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EID: 77955284898
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/ICEDSA.2010.5503040 Document Type: Conference Paper |
Times cited : (39)
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References (8)
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