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Volumn 22, Issue 2, 1997, Pages 229-235

Normal-super-normal double tunneling junction fabricated in a split-gate wire

Author keywords

2DEG; NSN tunneling; STM fabrication

Indexed keywords

ELECTRON TUNNELING; ETCHING; EVAPORATION; SCANNING ELECTRON MICROSCOPY; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTOR DEVICE MANUFACTURE; TUNGSTEN; TUNNEL JUNCTIONS;

EID: 0030656699     PISSN: 07496036     EISSN: None     Source Type: Journal    
DOI: 10.1006/spmi.1996.0255     Document Type: Article
Times cited : (2)

References (20)
  • 2
    • 0001376187 scopus 로고
    • edited by H. Grabert and M. H. Devoret Plenum Press, New York
    • H. V. Houten and C. W. J. Beenakker Single Charge Tunneling, edited by H. Grabert and M. H. Devoret (Plenum Press, New York, 1992) p. 167.
    • (1992) Single Charge Tunneling , pp. 167
    • Houten, H.V.1    Beenakker, C.W.J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.