Simulation of transient eddy-current measurement for the characterization of depth and conductivity of a conductive plate

IEEE Transactions on Magnetics

Volumn 44, Issue 11 PART 1, 2008, Pages 3281-3284

  Cheng, Weiying ^a   Komura, Ichiro ^a  

^a Japan Power Engineering and Inspection Corporation   (Japan)

Author keywords

Conductivity measurement; Eddy current testing; Impulse response; Thickness measurement

Indexed keywords

EID: 77955105088     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2008.2001613     Document Type: Article

References (7)

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7. S. Kanemoto, W. Cheng, and I. Komura, "Depth sizing of complex shape cracks using ECT signals," presented at the 13th Int. Symposium Applied Electromagnetic Mechanics, East Lansing, MI, 2007, unpublished.