SCOPUS 정보 검색 플랫폼

Volumn 405, Issue 13, 2010, Pages 2896-2899

Josephson effect in graphene SNS junction with a single localized defect

(2) Bolmatov, Dima a,b Mou, Chung Yu a,b

a NATIONAL TSING HUA UNIVERSITY (Taiwan)

b NATIONAL CENTER FOR THEORETICAL SCIENCES (Taiwan)

Author keywords

Electronic structure of nanoscale materials; Electronic transport in nanoscale materials and structures; Localization effects

Indexed keywords

DEFECTS; ELECTRONIC STRUCTURE; JOSEPHSON JUNCTION DEVICES; NANOTECHNOLOGY; QUANTUM OPTICS; SCANNING TUNNELING MICROSCOPY; SHEAR WAVES; SUPERCONDUCTING MATERIALS; TRANSPORT PROPERTIES;

ANDREEV BOUND STATE; BOGOLIUBOV-DE GENNES EQUATIONS; ELECTRONIC STRUCTURE OF NANOSCALE MATERIALS; ELECTRONIC TRANSPORT PROPERTIES; LOCALIZATION EFFECT; NANOSCALE MATERIALS AND STRUCTURES; SUPERCONDUCTING ELECTRODES; TUNNELING CONDUCTANCE;

GRAPHENE;

EID: 77955090495 PISSN: 09214526 EISSN: None Source Type: Journal
DOI: 10.1016/j.physb.2010.04.015 Document Type: Article

Times cited : (31)

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