The x-ray microscopy beamline UE46-PGM2 at BESSY

AIP Conference Proceedings

Volumn 1234, Issue , 2010, Pages 323-326

  Follath, R ^a   Schmidt, J S ^a   Weigand, M ^b   Fauth, K ^c  

^a HAHN MEITNER INSTITUT   (Germany)

^b MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

^c UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

Author keywords

Monochromator; X ray microscope

Indexed keywords

EID: 77955046518     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.3463201     Document Type: Conference Paper

References (9)

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